Highest c-axis oriented ZnO nanostructure thin film formed by dip-coating method for optic and electronic applications

ZnO thin film was deposited on glass substrate using sol-gel method and the effect of annealing temperature on the structural morphology and optical properties of ZnO thin films were investigated. Nanostructure ZnO thin films presenting well-defined orientation were obtained by dip coating. The ZnO thin films were pre-heated at 275 0C for 10 min. and annealed at 350, 450 and 550 0C for 60 min. As-deposited films are formed by amorphous zinc oxide-acetate submicron particles, which are transformed into a highly oriented ZnO after thermal treatment. The annealed ZnO thin films were transparent ca 85-90% in visible range with an absorption edges at about 375 nm. The morphologies, phase structure and the optical properties of the thin films were investigated by scanning electron microscopy (SEM), X-ray diffractometer (XRD), scanning electron microscope (SEM) and optical transmittance measurement which show that the ZnO/glass film is formed by a layer of ZnO nano-sized particles with average diameter of 40 nm.

کلیدواژه ها:

Thin Film ، ZnO ، Nanostructure ، Sol-Gel ، Dip Coating ،