Probe the nano thin films by phase sensitive neutron reflectometry; A simulation aspect

Neutron reflectometry is a powerful tool for research in nanostructured materials. It is a powerful technique for investigating surfaces and interfaces, thin films, nanostructures, biomembranes and magnetic films. Here, by a simulation model, we show that how it can be used to probe the nano thin films. It is shown that the data analyzing of neutron reflectivity leads to find the components of any thin film and their thicknesses

کلیدواژه ها:

Neutron reflectometry ، Nano thin films ، Scattering length density