X-ray characterization of nanocrystalline ceria

X-ray line profile analysis has been carried out to characterize the microstructure of polycrystalline cerium oxide. In order to determine the average coherent scattering domain size and dislocation density two techniques, namely modified Williamson-Hall and modified Warren-Averbach were employed. Modified Williamson-Hall plot provides the volume-weighted domain size =21.3(2) nm. Modified Warren-Averbach gives the area- weighted domain size =18.8(1) nm, the average dislocation density (assuming 50% edge and 50% screw dislocation) ρ=3.3(7)×1016m-2 and effective cut-off radius of dislocation, Re=23.1(4) nm