An improvement in XPS peak shape analysis; nanometalized polymer as a case study

We have improved XPS peak shape analysis for accurate characterization of metal nanostructures embeddedin a polymer matrix. We have determined the detailed in-depth distribution of cylindrical Au nanowire in polymer usingthe analysis of a single spectrum by taking into account the electron transport phenomena corresponding to both metaland polymer components. This means that we have made a very simple and nondestructive indirect 3D XPS imagingtechnique for inline characterization of bi-component surface nanostructures including metal and polymer. This is a verypromising technique for inline quality control of such surface nanostructures

کلیدواژه ها:

nanometalized polymer ، cylindrical gold nanowire ، x-ray photoelectron spectroscopy ، XPS peak shape analysis ، 3D XPS imaging