High Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip
محل انتشار: ماهنامه بین المللی مهندسی، دوره: 26، شماره: 6
سال انتشار: 1392
نوع سند: مقاله ژورنالی
زبان: انگلیسی
مشاهده: 966
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شناسه ملی سند علمی:
JR_IJE-26-6_004
تاریخ نمایه سازی: 17 خرداد 1393
چکیده مقاله:
In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, thedielectrophoresis method was applied due to its simple performance, cheapness and reliability. Here,specifically the effect of voltage on the deposition of MWNTs onto the tip of the atomic force microscope has been investigated while the other parameters held constant. Our experiments revealed that when the frequency was held at 5 MHz and 1 μL of MWNTs solution injected, the optimum voltage between tip and electrode surface was 6 V
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نویسندگان
j afzali
Department of Physics, University of Kurdistan, Sanandaj, Iran
z alemipour
Department of Physics, University of Kurdistan, Sanandaj, Iran
m hesam
Department of Physics, Ramhormoz Branch ,Islamic Azad University, Ramhormoz, Iran