Mehdipour - Center of Excellence on Applied Electromagnetic Systems, School of Electrical and Computer Eng., Univ. of Tehran,Iran
Kamarei - Center of Excellence on Applied Electromagnetic Systems, School of Electrical and Computer Eng., Univ. of Tehran,Iran

The fast method is presented to evaluate the effect of external incident waves on the microstrip crossovers embedded in high-speed multilayered circuit. Because of weak coupling between lines, combining the slandard Baum-Liu-Tesche (BLf) equations with lumped circuit model of cross region, the induced voltage in transmission line terminals due to the incident wave are determined in 1-20 GHz frequency range and the obtained results of this method are compared with which obtained by CST full-wave software tool.

Orthogonal microship lines, incident waves, multilayered media, coupling