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A Waveform Soft Model Extraction Method to Track Wire Behavior in Nano Scale Technologies

عنوان مقاله: A Waveform Soft Model Extraction Method to Track Wire Behavior in Nano Scale Technologies
شناسه ملی مقاله: ICEE21_403
منتشر شده در بیست و یکمین کنفرانس مهندسی برق ایران در سال 1392
مشخصات نویسندگان مقاله:

Atefesadat Seyedolhosseini - Advanced VLSI Lab., School of ECE, College of Eng., University of Tehran, Tehran, Iran
Nasser Masoumi

خلاصه مقاله:
In this paper a new method to extract the output waveform of interconnection wires in VLSI circuits is introduced. Multiple segments of a wire when used for modelextraction usually result in more complexity in the final transfer function and exhaustive calculations for wire responses such asdelay and power. The proposed method uses several segments of a wire and avoids complexity in the modelling expressions for waveform computations. The wire resistance, inductance,and capacitance are considered in the wire model, while input and output drivers are modelled with simple resistance andcapacitance, respectively. The obtained results are compared with enough number of segments. The estimated error for thetime delay when the output signal reaches to its 50% maximumvalue is less than 5% for the worst case.

کلمات کلیدی:
VLSI interconnects, Effective load capacitance, Wire segmentation model, Waveform extraction, Wire inductance effect

صفحه اختصاصی مقاله و دریافت فایل کامل: https://civilica.com/doc/208460/