A New 1GS/s Sampling Rate and 400µV Resolution with Reliable Power Consumption Dynamic Latched Type Comparator

A new high-speed dynamic latched type comparator with reliable resolution is presented in this paper. The proposed paper presents a 1GS/s sampling rate in presence of 5mV input offset, and it can detect the very low voltage differences such as ±200µV at the output nodes, reliably. The power consumption and delay time of the proposed circuit are 750µw and 257ps with the power supply of 1.8V, respectively. Furthermore, the proposed structure is the suitable candidate for high-speed SAR ADC, as well. Monte Carlo simulation using Virtuoso® Spectre shows that the comparator has suitable resolution when working at 1GHz. The active area of the proposed circuit is 613.73µm2. Simulation results of the suggested circuit are performed using the BSIM3 model of a 0.18µm CMOS process with the power supply of 1.8 volts at all process corners along with the different temperatures in the region -50℃ to +50℃, reliably.

کلیدواژه ها:

High-Resolution ، High-Speed ، Comparator ، ADC ، SAR ADC