Reliability Analysis of Logic Circuits Using Binary Probabilistic Transfer Matrix

سال انتشار: 1392
نوع سند: مقاله کنفرانسی
زبان: انگلیسی
مشاهده: 1,112

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شناسه ملی سند علمی:

ICEE21_419

تاریخ نمایه سازی: 27 مرداد 1392

چکیده مقاله:

Technology scales strongly increased the sensitivity of new integrated logic circuits to transient faults. Since the reliability of combinational circuit is an important factor indigital circuits design, so, a fast method to obtain accurate value of reliability becomes a main challenge. The main sourceof inaccuracy and scalability problems in existing methods is the presence of reconverging signals. In this paper a new library-based method is proposed to calculate the circuitreliability in which the effects of nested reconvergent paths is considered easily. So a binary probability matrix is used toresolve signals correlation problem. Simulation results show that our proposed method gives accurate reliability value with less complexity than previous methods.

نویسندگان

Hamed Zandevakili

Department of Electrical Engineering, Shahid Bahonar University, Kerman, Iran