X-ray scattering studies of the interface structure of Co/Pd mgnetic multilayer thin films

In this paper magnetic and structural properties of a series of sputtered Co/Pd multilayer thin films have been investigated. High-Angle X-Ray Diffraction (HAXRD) measurements using a Cuk(a) laboratory x-ray source indicate a modulated structure which is strongly textured grown along (111) direction. The relation between intensity and the number of bilayers for different peaks of HAXRD spectrum has been investigated. Interface morphology has also been studied from Grazing Incidence Specular and Off-specular x-ray measurements using synchrotron radiation and has been compared to the HAXRD results. Vibrating Sample Magnetometer (VSM) measurements have shown perpendicular magnetic anisotropy for all samples with k(eff) reaching highest value for those samples with highest fractal parameter.