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گواهی نمایه سازی مقاله Surface Chemical Analysis of Cotton

عنوان مقاله: Surface Chemical Analysis of Cotton
شناسه (COI) مقاله: ISPST10_710
منتشر شده در دهمین سمینار بین المللی علوم و تکنولوژی پلیمر در سال ۱۳۹۱
مشخصات نویسندگان مقاله:

S Shekarriz - Colour and Polymer Research Centre, Amirkabir University of Technology, Tehran, Iran
S Mohamadzade Moghadam - Colour and Polymer Research Centre, Amirkabir University of Technology, Tehran, Iran
C.M CARR - School of Materials , University of Manchester, Manchester, UK

خلاصه مقاله:
XPS is one of the most well known techniques , allowing chemical analysis of a material surface to adepth of 3-5 nm(1). In XPS the diagnostic parameter is the electron bindingenergy(BE) , which is determined (Equation 1) by measuring the kinetic energy (KE) of photoelectrons emitted by x-raysphotons, of energy hʋ, impinging on the sample surface: KE = hʋ - BE [1] The value of the binding energy is not only characteristic ofthe emitting atom(i.e. enables elemental identification) butalso has a precise value, which is dependent on the chemical environment of that atom.Time-of-Flight Secondary Ion Mass Spectroscopy (ToFSIMS)is also a surface sensitive technique able to probe the outer 1-2 nm of materials. It involves bombarding thematerials surface with a primary particle beam and analysing the emitted secondary ions. In addition to providing elementalinformation the technique is able to detect larger molecular species[1-3]. Thus in combination with XPS comprehensive characterisation of cotton fibre surfaces can be achieved

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