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A Method for Determining the Critical Parts of Electronic Circuits into EFT/B

عنوان مقاله: A Method for Determining the Critical Parts of Electronic Circuits into EFT/B
شناسه ملی مقاله: SASTECH07_122
منتشر شده در هفتمین سمپوزیوم بین المللی پیشرفتهای علوم و تکنولوژی در سال 1391
مشخصات نویسندگان مقاله:

B.Gh Family - Communication Department, Niroo Research Institute, Iran.
V.H Vaghef - Communication Department, Niroo Research Institute, Iran.
M Shabro - Communication Department, Niroo Research Institute, Iran.

خلاصه مقاله:
Electrical Fast Transient/Burst Immunity testing is an important safety measure that examines thedisturbances caused by switching power supplies, inductors, contact relays, or high voltageswitches on electric and electronic equipment and allows system designers to study the efficiencyof the equipment under this type of system disturbance. If a compliancy test is performedaccording to the current standard method of testing and the result shows a failure, detecting thesusceptible point is difficult, and repeating the test in the EMC reference laboratory is very timeconsuming and costly. With a low-cost EFT/B simulator circuit, the critical and sensitive pointscan be identified sooner and they can be resolved at design phase.

کلمات کلیدی:
Electromagnetic Compatibility, EFT/B

صفحه اختصاصی مقاله و دریافت فایل کامل: https://civilica.com/doc/205258/